ISTFA 2014 : : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / / organized by Electronic Device Failure Analysis Society, ASM International.

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Place / Publishing House:Materials Park, Ohio : : ASM International,, 2014.
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (560 pages) :; color illustrations, photographs
Notes:Includes index.
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LEADER 02327nam a2200433 i 4500
001 5003002486
003 MiAaPQ
005 20200520144314.0
006 m o d |
007 cr cnu||||||||
008 150109t20142014ohuao o 001 0 eng d
020 |z 9781627080743 
020 |a 9781627080750  |q (electronic bk.) 
035 |a (MiAaPQ)5003002486 
035 |a (Au-PeEL)EBL3002486 
035 |a (CaPaEBR)ebr10998999 
035 |a (OCoLC)929147993 
040 |a MiAaPQ  |b eng  |e rda  |e pn  |c MiAaPQ  |d MiAaPQ 
050 4 |a TK7871  |b .I884 2014 
082 0 |a 621.381  |2 23 
111 2 |a International Symposium for Testing and Failure Analysis  |n (40th :  |d 2014 :  |c Houston, Tex.) 
245 1 0 |a ISTFA 2014 :  |b conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /  |c organized by Electronic Device Failure Analysis Society, ASM International. 
264 1 |a Materials Park, Ohio :  |b ASM International,  |c 2014. 
264 4 |c 2014 
300 |a 1 online resource (560 pages) :  |b color illustrations, photographs 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
500 |a Includes index. 
588 |a Description based on online resource; title from PDF title page (ebrary, viewed January 9, 2014). 
590 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 4 |a Electronic books. 
710 2 |a Electronic Device Failure Analysis Society,  |e organizer. 
710 2 |a ASM International,  |e organizer. 
776 0 8 |i Print version:  |a International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)  |t ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA.  |d Materials Park, Ohio : ASM International, c2014   |h xx, 540 pages   |z 9781627080743 
797 2 |a ProQuest (Firm) 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3002486  |z Click to View