Measurement technology and its application III : : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / / edited by Prasad Yarlagadda and Yun-Hae Kim.

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Bibliographic Details
Superior document:Applied Mechanics and Materials, Volume 568-570
:
TeilnehmendeR:
Place / Publishing House:Zurich, Switzerland : : TTP,, 2014.
2014
Year of Publication:2014
Language:English
Series:Applied mechanics and materials ; Volume 568-570.
Online Access:
Physical Description:1 online resource (2012 pages) :; illustrations (some color), graphs, tables.
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