Measurement technology and its application III : : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / / edited by Prasad Yarlagadda and Yun-Hae Kim.
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| Superior document: | Applied Mechanics and Materials, Volume 568-570 |
|---|---|
| : | |
| TeilnehmendeR: | |
| Place / Publishing House: | Zurich, Switzerland : : TTP,, 2014. 2014 |
| Year of Publication: | 2014 |
| Language: | English |
| Series: | Applied mechanics and materials ;
Volume 568-570. |
| Online Access: | |
| Physical Description: | 1 online resource (2012 pages) :; illustrations (some color), graphs, tables. |
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5001910833 |
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(MiAaPQ)5001910833 (Au-PeEL)EBL1910833 (CaPaEBR)ebr10895068 (OCoLC)899159107 |
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International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China) Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. ICMIA 2014 Zurich, Switzerland : TTP, 2014. 2014 1 online resource (2012 pages) : illustrations (some color), graphs, tables. text rdacontent computer rdamedia online resource rdacarrier Applied Mechanics and Materials, 1662-7482 ; Volume 568-570 Includes bibliographical references at the end of each chapters and indexes. Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014). Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Detectors Congresses. Measurement Congresses. Measuring instruments Congresses. Electronic books. Yarlagadda, Prasad, editor. Kim, Yun-Hae, editor. Print version: International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China) Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China. Zurich, Switzerland : TTP, c2014 2021 pages Applied mechanics and materials ; Volume 568-570. 9783038351382 ProQuest (Firm) Applied mechanics and materials ; Volume 568-570. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1910833 Click to View |
| language |
English |
| format |
Conference Proceeding eBook |
| author2 |
Yarlagadda, Prasad, Kim, Yun-Hae, |
| author_facet |
Yarlagadda, Prasad, Kim, Yun-Hae, International Conference on Measurement, Instrumentation and Automation Shanghai, China) |
| author2_variant |
p y py y h k yhk |
| author2_role |
TeilnehmendeR TeilnehmendeR |
| author_corporate |
International Conference on Measurement, Instrumentation and Automation Shanghai, China) |
| author_sort |
International Conference on Measurement, Instrumentation and Automation Shanghai, China) |
| title |
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / |
| spellingShingle |
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / Applied Mechanics and Materials, |
| title_sub |
selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / |
| title_full |
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. |
| title_fullStr |
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. |
| title_full_unstemmed |
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. |
| title_auth |
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / |
| title_new |
Measurement technology and its application III : |
| title_sort |
measurement technology and its application iii : selected, peer reviewed papers from the 2014 3rd international conference on measurement, instrumentation and automation (icmia 2014), april 23-24, 2014, shanghai, china / |
| series |
Applied Mechanics and Materials, |
| series2 |
Applied Mechanics and Materials, |
| publisher |
TTP, |
| publishDate |
2014 |
| physical |
1 online resource (2012 pages) : illustrations (some color), graphs, tables. |
| isbn |
9783038265214 9783038351382 |
| issn |
1662-7482 ; |
| callnumber-first |
T - Technology |
| callnumber-subject |
TA - General and Civil Engineering |
| callnumber-label |
TA165 |
| callnumber-sort |
TA 3165 I584 42014 |
| genre |
Electronic books. |
| genre_facet |
Congresses. Electronic books. |
| url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1910833 |
| illustrated |
Illustrated |
| dewey-hundreds |
600 - Technology |
| dewey-tens |
680 - Manufacture for specific uses |
| dewey-ones |
681 - Precision instruments & other devices |
| dewey-full |
681.2 |
| dewey-sort |
3681.2 |
| dewey-raw |
681.2 |
| dewey-search |
681.2 |
| oclc_num |
899159107 |
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| hierarchy_sequence |
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Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / |
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