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Measurement technology and its application III : : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / / edited by Prasad Yarlagadda and Yun-Hae Kim.

Participants: International Conference on Measurement, Instrumentation and Automation Shanghai, China) [ ]; Yarlagadda, Prasad, [ TeilnehmendeR ]; Kim, Yun-Hae, [ TeilnehmendeR ]
Published: 2014.
Superior document: Applied Mechanics and Materials, Volume 568-570

“...International Conference on Measurement, Instrumentation and Automation Shanghai, China)...”

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