Measurement technology and its application III : : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / / edited by Prasad Yarlagadda and Yun-Hae Kim.

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Bibliographic Details
Superior document:Applied Mechanics and Materials, Volume 568-570
:
TeilnehmendeR:
Place / Publishing House:Zurich, Switzerland : : TTP,, 2014.
2014
Year of Publication:2014
Language:English
Series:Applied mechanics and materials ; Volume 568-570.
Online Access:
Physical Description:1 online resource (2012 pages) :; illustrations (some color), graphs, tables.
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245 1 0 |a Measurement technology and its application III :  |b selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /  |c edited by Prasad Yarlagadda and Yun-Hae Kim. 
246 1 |a ICMIA 2014 
264 1 |a Zurich, Switzerland :  |b TTP,  |c 2014. 
264 4 |c 2014 
300 |a 1 online resource (2012 pages) :  |b illustrations (some color), graphs, tables. 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
490 1 |a Applied Mechanics and Materials,  |x 1662-7482 ;  |v Volume 568-570 
504 |a Includes bibliographical references at the end of each chapters and indexes. 
588 |a Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014). 
590 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Detectors  |v Congresses. 
650 0 |a Measurement  |v Congresses. 
650 0 |a Measuring instruments  |v Congresses. 
655 4 |a Electronic books. 
700 1 |a Yarlagadda, Prasad,  |e editor. 
700 1 |a Kim, Yun-Hae,  |e editor. 
776 0 8 |i Print version:  |a International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China)  |t Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China.  |d Zurich, Switzerland : TTP, c2014   |h 2021 pages   |k Applied mechanics and materials ; Volume 568-570.  |z 9783038351382 
797 2 |a ProQuest (Firm) 
830 0 |a Applied mechanics and materials ;  |v Volume 568-570. 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1910833  |z Click to View