Defects-recognition, imaging and physics in semiconductors XIV : : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /

Defects-recognition, imaging and physics in semiconductors XIV : : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

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Superior document:Materials science forum ; vol. 725
:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan)
TeilnehmendeR:
Yamada-Kaneta, Hiroshi.
Sakai, Akira (Professor of engineering science)
Place / Publishing House:Durnten-Zurich ;, Enfield, NH : : Trans Tech Publications,, [2012]
2012
Year of Publication:2012
Language:English
Series:Materials science forum ; v. 725.
Online Access:
Physical Description:1 online resource (300 pages).
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(CaPaEBR)ebr10777688
(OCoLC)809121077
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spelling International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
2012
1 online resource (300 pages).
text rdacontent
computer rdamedia
online resource rdacarrier
Materials science forum ; vol. 725
Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Semiconductors Defects Congresses.
Physics Congresses.
Electronic books.
Yamada-Kaneta, Hiroshi.
Sakai, Akira (Professor of engineering science)
ProQuest (Firm)
Materials science forum ; v. 725.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1872887 Click to View
language English
format Conference Proceeding
eBook
author2 Yamada-Kaneta, Hiroshi.
Sakai, Akira (Professor of engineering science)
author_facet Yamada-Kaneta, Hiroshi.
Sakai, Akira (Professor of engineering science)
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan)
author2_variant h y k hyk
a s as
author2_role TeilnehmendeR
TeilnehmendeR
author_corporate International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan)
author_sort International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan)
title Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
spellingShingle Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Materials science forum ;
title_sub selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
title_full Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
title_fullStr Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
title_full_unstemmed Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
title_auth Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
title_new Defects-recognition, imaging and physics in semiconductors XIV :
title_sort defects-recognition, imaging and physics in semiconductors xiv : selected, peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, september 25-29, 2011. miyazaki, japan /
series Materials science forum ;
series2 Materials science forum ;
publisher Trans Tech Publications,
publishDate 2012
physical 1 online resource (300 pages).
isbn 9783038138563
callnumber-first Q - Science
callnumber-subject QC - Physics
callnumber-label QC611
callnumber-sort QC 3611.6 D4 I58 42011
genre Electronic books.
genre_facet Congresses.
Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1872887
illustrated Not Illustrated
oclc_num 809121077
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AT yamadakanetahiroshi defectsrecognitionimagingandphysicsinsemiconductorsxivselectedpeerreviewedpapersfromthe14thinternationalconferenceondefectsrecognitionimagingandphysicsinsemiconductorsseptember25292011miyazakijapan
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