Defects-recognition, imaging and physics in semiconductors XIV : : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
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Superior document: | Materials science forum ; vol. 725 |
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Place / Publishing House: | Durnten-Zurich ;, Enfield, NH : : Trans Tech Publications,, [2012] 2012 |
Year of Publication: | 2012 |
Language: | English |
Series: | Materials science forum ;
v. 725. |
Online Access: | |
Physical Description: | 1 online resource (300 pages). |
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111 | 2 | |a International Conference on Defects: Recognition, Imaging and Physics in Semiconductors |n (14th : |d 2011 : |c Miyazaki-shi, Japan) | |
245 | 1 | 0 | |a Defects-recognition, imaging and physics in semiconductors XIV : |b selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / |c edited by Hiroshi Yamada-Kaneta and Akira Sakai. |
264 | 1 | |a Durnten-Zurich ; |a Enfield, NH : |b Trans Tech Publications, |c [2012] | |
264 | 4 | |c 2012 | |
300 | |a 1 online resource (300 pages). | ||
336 | |a text |2 rdacontent | ||
337 | |a computer |2 rdamedia | ||
338 | |a online resource |2 rdacarrier | ||
490 | 1 | |a Materials science forum ; |v vol. 725 | |
588 | |a Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013). | ||
590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 | |a Semiconductors |x Defects |v Congresses. | |
650 | 0 | |a Physics |v Congresses. | |
655 | 4 | |a Electronic books. | |
700 | 1 | |a Yamada-Kaneta, Hiroshi. | |
700 | 1 | |a Sakai, Akira |c (Professor of engineering science) | |
797 | 2 | |a ProQuest (Firm) | |
830 | 0 | |a Materials science forum ; |v v. 725. | |
856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1872887 |z Click to View |