Defects-recognition, imaging and physics in semiconductors XIV : : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

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Bibliographic Details
Superior document:Materials science forum ; vol. 725
:
TeilnehmendeR:
Place / Publishing House:Durnten-Zurich ;, Enfield, NH : : Trans Tech Publications,, [2012]
2012
Year of Publication:2012
Language:English
Series:Materials science forum ; v. 725.
Online Access:
Physical Description:1 online resource (300 pages).
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245 1 0 |a Defects-recognition, imaging and physics in semiconductors XIV :  |b selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /  |c edited by Hiroshi Yamada-Kaneta and Akira Sakai. 
264 1 |a Durnten-Zurich ;  |a Enfield, NH :  |b Trans Tech Publications,  |c [2012] 
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300 |a 1 online resource (300 pages). 
336 |a text  |2 rdacontent 
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490 1 |a Materials science forum ;  |v vol. 725 
588 |a Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013). 
590 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Semiconductors  |x Defects  |v Congresses. 
650 0 |a Physics  |v Congresses. 
655 4 |a Electronic books. 
700 1 |a Yamada-Kaneta, Hiroshi. 
700 1 |a Sakai, Akira  |c (Professor of engineering science) 
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830 0 |a Materials science forum ;  |v v. 725. 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1872887  |z Click to View