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Defects-recognition, imaging and physics in semiconductors XIV : : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

Participants: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan) [ ]; Yamada-Kaneta, Hiroshi. [ TeilnehmendeR ]; Sakai, Akira (Professor of engineering science) [ TeilnehmendeR ]
Published: [2012]
Superior document: Materials science forum ; vol. 725

“...International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki...”

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