Defects-recognition, imaging and physics in semiconductors XIV : : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
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| Superior document: | Materials science forum ; vol. 725 |
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| Place / Publishing House: | Durnten-Zurich ;, Enfield, NH : : Trans Tech Publications,, [2012] 2012 |
| Year of Publication: | 2012 |
| Language: | English |
| Series: | Materials science forum ;
v. 725. |
| Online Access: | |
| Physical Description: | 1 online resource (300 pages). |
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| ISBN: | 9783037854426 (pbk.) 9783038138563 |
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| Hierarchical level: | Monograph |
| Statement of Responsibility: | edited by Hiroshi Yamada-Kaneta and Akira Sakai. |