Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.
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| : | |
|---|---|
| TeilnehmendeR: | |
| Year of Publication: | 2001 |
| Edition: | 3rd ed. |
| Language: | English |
| Online Access: | |
| Physical Description: | xi, 251 p. :; ill. |
| Notes: | Previous ed.: 1988. |
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