Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.
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| Year of Publication: | 2001 |
| Edition: | 3rd ed. |
| Language: | English |
| Online Access: | |
| Physical Description: | xi, 251 p. :; ill. |
| Notes: | Previous ed.: 1988. |
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| 082 | 0 | 4 | |a 502.825 |2 21 |
| 100 | 1 | |a Goodhew, Peter J. | |
| 245 | 1 | 0 | |a Electron microscopy and analysis |h [electronic resource] / |c Peter J. Goodhew, John Humphreys, Richard Beanland. |
| 250 | |a 3rd ed. | ||
| 260 | |a London : |b Taylor & Francis, |c 2001. | ||
| 300 | |a xi, 251 p. : |b ill. | ||
| 500 | |a Previous ed.: 1988. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Electron microscopy. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Beanland, R. | |
| 700 | 1 | |a Humphreys, F. J. | |
| 710 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=168520 |z Click to View |