SiC based Miniaturized Devices

MEMS devices are found in many of today’s electronic devices and systems, from air-bag sensors in cars to smart phones, embedded systems, etc. Increasingly, the reduction in dimensions has led to nanometer-scale devices, called NEMS. The plethora of applications on the commercial market speaks for i...

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Year of Publication:2020
Language:English
Physical Description:1 electronic resource (170 pages)
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spelling SiC based Miniaturized Devices
Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2020
1 electronic resource (170 pages)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
MEMS devices are found in many of today’s electronic devices and systems, from air-bag sensors in cars to smart phones, embedded systems, etc. Increasingly, the reduction in dimensions has led to nanometer-scale devices, called NEMS. The plethora of applications on the commercial market speaks for itself, and especially for the highly precise manufacturing of silicon-based MEMS and NEMS. While this is a tremendous achievement, silicon as a material has some drawbacks, mainly in the area of mechanical fatigue and thermal properties. Silicon carbide (SiC), a well-known wide-bandgap semiconductor whose adoption in commercial products is experiening exponential growth, especially in the power electronics arena. While SiC MEMS have been around for decades, in this Special Issue we seek to capture both an overview of the devices that have been demonstrated to date, as well as bring new technologies and progress in the MEMS processing area to the forefront. Thus, this Special Issue seeks to showcase research papers, short communications, and review articles that focus on: (1) novel designs, fabrication, control, and modeling of SiC MEMS and NEMS based on all kinds of actuation mechanisms; and (2) new developments in applying SiC MEMS and NEMS in consumer electronics, optical communications, industry, medicine, agriculture, space, and defense.
English
Engineering History.
Technology History.
high-power impulse magnetron sputtering (HiPIMS)
silicon carbide
aluminum nitride
thin film
Rutherford backscattering spectrometry (RBS)
grazing incidence X-ray diffraction (GIXRD)
Raman spectroscopy
6H-SiC
indentation
deformation
material removal mechanisms
critical load
4H-SiC
critical depth of cut
Berkovich indenter
cleavage strength
nanoscratching
power electronics
high-temperature converters
MEMS devices
SiC power electronic devices
neural interface
neural probe
neural implant
microelectrode array
MEA
SiC
3C-SiC
doped SiC
n-type
p-type
amorphous SiC
epitaxial growth
electrochemical characterization
MESFET
simulation
PAE
bulk micromachining
electrochemical etching
circular membrane
bulge test
vibrometry
mechanical properties
Young's modulus
residual stress
FEM
semiconductor radiation detector
microstrip detector
power module
negative gate-source voltage spike
4H-SiC, epitaxial layer
Schottky barrier
radiation detector
point defects
deep level transient spectroscopy (DLTS)
thermally stimulated current spectroscopy (TSC)
electron beam induced current spectroscopy (EBIC)
pulse height spectroscopy (PHS)
3-03936-010-8
3-03936-011-6
Saddow, Stephen Edward. editor.
Alquier, Daniel. editor.
Wang, Jing, 1978 March- editor.
La Via, Francesco. editor.
Fraga, Mariana Amorim, editor.
Saddow, Stephen E., other
Alquier, Daniel oth
Wang, Jing oth
La Via, Francesco oth
Fraga, Mariana oth
language English
format eBook
author2 Saddow, Stephen Edward.
Alquier, Daniel.
Wang, Jing, 1978 March-
La Via, Francesco.
Fraga, Mariana Amorim,
Saddow, Stephen E.,
Alquier, Daniel
Wang, Jing
La Via, Francesco
Fraga, Mariana
author_facet Saddow, Stephen Edward.
Alquier, Daniel.
Wang, Jing, 1978 March-
La Via, Francesco.
Fraga, Mariana Amorim,
Saddow, Stephen E.,
Alquier, Daniel
Wang, Jing
La Via, Francesco
Fraga, Mariana
author2_variant s e s se ses
d a da
j w jw
v f l vf vfl
m a f ma maf
author2_role TeilnehmendeR
TeilnehmendeR
TeilnehmendeR
TeilnehmendeR
TeilnehmendeR
TeilnehmendeR
Sonstige
Sonstige
Sonstige
Sonstige
title SiC based Miniaturized Devices
spellingShingle SiC based Miniaturized Devices
title_full SiC based Miniaturized Devices
title_fullStr SiC based Miniaturized Devices
title_full_unstemmed SiC based Miniaturized Devices
title_auth SiC based Miniaturized Devices
title_new SiC based Miniaturized Devices
title_sort sic based miniaturized devices
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2020
physical 1 electronic resource (170 pages)
isbn 3-03936-010-8
3-03936-011-6
illustrated Not Illustrated
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