Ellipsometry : : Principles and Techniques for Materials Characterization / / edited by Faustino Wahaia.

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...

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Place / Publishing House:Rijeka, Croatia : : IntechOpen,, 2017.
Year of Publication:2017
Language:English
Physical Description:1 online resource (160 pages) :; illustrations
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spelling Faustino Wahaia auth
Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia.
Ellipsometry
IntechOpen 2017
Rijeka, Croatia : IntechOpen, 2017.
1 online resource (160 pages) : illustrations
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Description based on: online resource; title from PDF information screen (InTech, viewed October 10, 2022).
Includes bibliographical references.
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
English
Ellipsometry.
Physical Sciences
Engineering and Technology
Optoelectronics
Physics
Optics and Lasers
953-51-3623-2
Wahaia, Faustino, editor.
language English
format eBook
author Faustino Wahaia
spellingShingle Faustino Wahaia
Ellipsometry : Principles and Techniques for Materials Characterization /
author_facet Faustino Wahaia
Wahaia, Faustino,
author_variant f w fw
author2 Wahaia, Faustino,
author2_variant f w fw
author2_role TeilnehmendeR
author_sort Faustino Wahaia
title Ellipsometry : Principles and Techniques for Materials Characterization /
title_sub Principles and Techniques for Materials Characterization /
title_full Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia.
title_fullStr Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia.
title_full_unstemmed Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia.
title_auth Ellipsometry : Principles and Techniques for Materials Characterization /
title_alt Ellipsometry
title_new Ellipsometry :
title_sort ellipsometry : principles and techniques for materials characterization /
publisher IntechOpen
IntechOpen,
publishDate 2017
physical 1 online resource (160 pages) : illustrations
isbn 953-51-4592-4
953-51-3624-0
953-51-3623-2
callnumber-first Q - Science
callnumber-subject QC - Physics
callnumber-label QC443
callnumber-sort QC 3443 E455 42017
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 620 - Engineering & allied operations
dewey-full 620.11295
dewey-sort 3620.11295
dewey-raw 620.11295
dewey-search 620.11295
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