Ellipsometry : : Principles and Techniques for Materials Characterization / / edited by Faustino Wahaia.
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...
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Place / Publishing House: | Rijeka, Croatia : : IntechOpen,, 2017. |
Year of Publication: | 2017 |
Language: | English |
Physical Description: | 1 online resource (160 pages) :; illustrations |
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(CKB)4970000000099658 (NjHacI)994970000000099658 (oapen)https://directory.doabooks.org/handle/20.500.12854/46217 (EXLCZ)994970000000099658 |
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Faustino Wahaia auth Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia. Ellipsometry IntechOpen 2017 Rijeka, Croatia : IntechOpen, 2017. 1 online resource (160 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Description based on: online resource; title from PDF information screen (InTech, viewed October 10, 2022). Includes bibliographical references. Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization. English Ellipsometry. Physical Sciences Engineering and Technology Optoelectronics Physics Optics and Lasers 953-51-3623-2 Wahaia, Faustino, editor. |
language |
English |
format |
eBook |
author |
Faustino Wahaia |
spellingShingle |
Faustino Wahaia Ellipsometry : Principles and Techniques for Materials Characterization / |
author_facet |
Faustino Wahaia Wahaia, Faustino, |
author_variant |
f w fw |
author2 |
Wahaia, Faustino, |
author2_variant |
f w fw |
author2_role |
TeilnehmendeR |
author_sort |
Faustino Wahaia |
title |
Ellipsometry : Principles and Techniques for Materials Characterization / |
title_sub |
Principles and Techniques for Materials Characterization / |
title_full |
Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia. |
title_fullStr |
Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia. |
title_full_unstemmed |
Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia. |
title_auth |
Ellipsometry : Principles and Techniques for Materials Characterization / |
title_alt |
Ellipsometry |
title_new |
Ellipsometry : |
title_sort |
ellipsometry : principles and techniques for materials characterization / |
publisher |
IntechOpen IntechOpen, |
publishDate |
2017 |
physical |
1 online resource (160 pages) : illustrations |
isbn |
953-51-4592-4 953-51-3624-0 953-51-3623-2 |
callnumber-first |
Q - Science |
callnumber-subject |
QC - Physics |
callnumber-label |
QC443 |
callnumber-sort |
QC 3443 E455 42017 |
illustrated |
Illustrated |
dewey-hundreds |
600 - Technology |
dewey-tens |
620 - Engineering |
dewey-ones |
620 - Engineering & allied operations |
dewey-full |
620.11295 |
dewey-sort |
3620.11295 |
dewey-raw |
620.11295 |
dewey-search |
620.11295 |
work_keys_str_mv |
AT faustinowahaia ellipsometryprinciplesandtechniquesformaterialscharacterization AT wahaiafaustino ellipsometryprinciplesandtechniquesformaterialscharacterization AT faustinowahaia ellipsometry AT wahaiafaustino ellipsometry |
status_str |
n |
ids_txt_mv |
(CKB)4970000000099658 (NjHacI)994970000000099658 (oapen)https://directory.doabooks.org/handle/20.500.12854/46217 (EXLCZ)994970000000099658 |
carrierType_str_mv |
cr |
is_hierarchy_title |
Ellipsometry : Principles and Techniques for Materials Characterization / |
author2_original_writing_str_mv |
noLinkedField |
_version_ |
1787548850679971840 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01059nam a2200301 i 4500</leader><controlfield tag="001">993545127504498</controlfield><controlfield tag="005">20221014155021.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr |||||||||||</controlfield><controlfield tag="008">221014s2017 ci a ob 000 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">953-51-4592-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">953-51-3624-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)4970000000099658</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(NjHacI)994970000000099658</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(oapen)https://directory.doabooks.org/handle/20.500.12854/46217</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)994970000000099658</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">NjHacI</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="c">NjHacl</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QC443</subfield><subfield code="b">.E455 2017</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620.11295</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Faustino Wahaia</subfield><subfield code="4">auth</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Ellipsometry :</subfield><subfield code="b">Principles and Techniques for Materials Characterization /</subfield><subfield code="c">edited by Faustino Wahaia.</subfield></datafield><datafield tag="246" ind1=" " ind2=" "><subfield code="a">Ellipsometry </subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="b">IntechOpen</subfield><subfield code="c">2017</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Rijeka, Croatia :</subfield><subfield code="b">IntechOpen,</subfield><subfield code="c">2017.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (160 pages) :</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on: online resource; title from PDF information screen (InTech, viewed October 10, 2022).</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">English</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Ellipsometry.</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Physical Sciences</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Engineering and Technology</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Optoelectronics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Physics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Optics and Lasers</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">953-51-3623-2</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wahaia, Faustino,</subfield><subfield code="e">editor.</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">BOOK</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-02-22 20:11:43 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2019-04-13 22:04:18 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="i">DOAB Directory of Open Access Books</subfield><subfield code="P">DOAB Directory of Open Access Books</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&portfolio_pid=5351636130004498&Force_direct=true</subfield><subfield code="Z">5351636130004498</subfield><subfield code="b">Available</subfield><subfield code="8">5351636130004498</subfield></datafield></record></collection> |