Ellipsometry : : Principles and Techniques for Materials Characterization / / edited by Faustino Wahaia.

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...

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Place / Publishing House:Rijeka, Croatia : : IntechOpen,, 2017.
Year of Publication:2017
Language:English
Physical Description:1 online resource (160 pages) :; illustrations
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588 |a Description based on: online resource; title from PDF information screen (InTech, viewed October 10, 2022). 
504 |a Includes bibliographical references. 
520 |a Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization. 
546 |a English 
650 0 |a Ellipsometry. 
653 |a Physical Sciences 
653 |a Engineering and Technology 
653 |a Optoelectronics 
653 |a Physics 
653 |a Optics and Lasers 
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