Ellipsometry : : Principles and Techniques for Materials Characterization / / edited by Faustino Wahaia.

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...

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Place / Publishing House:Rijeka, Croatia : : IntechOpen,, 2017.
Year of Publication:2017
Language:English
Physical Description:1 online resource (160 pages) :; illustrations
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Other title:Ellipsometry
Summary:Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
Bibliography:Includes bibliographical references.
ISBN:9535145924
9535136240
Hierarchical level:Monograph
Statement of Responsibility: edited by Faustino Wahaia.