Shortfalls of panel unit root testing

Shortfalls of panel unit root testing / Jack Strauss ; Taner Yigit

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Bibliographic Details
VerfasserIn:
Strauss, Jack
Yigit, Taner M.
Place / Publishing House:Amsterdam [u.a.] : Elsevier, 2003
Year of Publication:2003
Language:English
Physical Description:S. [309] - 313
Notes:
  • Literaturverz. S. 312 - 313
  • Aus: Economics letters ; 81.2003
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Shortfalls of panel unit root testing Jack Strauss ; Taner Yigit
Amsterdam [u.a.] Elsevier 2003
S. [309] - 313
Literaturverz. S. 312 - 313
Aus: Economics letters ; 81.2003
Yigit, Taner M. (DE-588)171920724 aut
YWIFD DIGIT VID-DG-Shortfalls of panel unit root testing,Strauss 2218518240004498
language English
format Book
author Strauss, Jack
Yigit, Taner M.
spellingShingle Strauss, Jack
Yigit, Taner M.
Shortfalls of panel unit root testing
author_facet Strauss, Jack
Yigit, Taner M.
Yigit, Taner M.
author_variant j s js
t m y tm tmy
author_role VerfasserIn
VerfasserIn
author2 Yigit, Taner M.
author2_role VerfasserIn
author_sort Strauss, Jack
title Shortfalls of panel unit root testing
title_full Shortfalls of panel unit root testing Jack Strauss ; Taner Yigit
title_fullStr Shortfalls of panel unit root testing Jack Strauss ; Taner Yigit
title_full_unstemmed Shortfalls of panel unit root testing Jack Strauss ; Taner Yigit
title_auth Shortfalls of panel unit root testing
title_new Shortfalls of panel unit root testing
title_sort shortfalls of panel unit root testing
publisher Elsevier
publishDate 2003
physical S. [309] - 313
callnumber-raw VID-DG-Shortfalls of panel unit root testing,Strauss
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