Shortfalls of panel unit root testing / Jack Strauss ; Taner Yigit
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| Place / Publishing House: | Amsterdam [u.a.] : Elsevier, 2003 |
| Year of Publication: | 2003 |
| Language: | English |
| Physical Description: | S. [309] - 313 |
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OeAW Vienna Institute of Demography - VID
| Location: | Digit. Objektsammlung |
| Call Numbers: | VID-DG-Shortfalls of panel unit root testing,Strauss |
| Call Number | 2nd Call Number | Description | Location | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| VID-DG-Shortfalls of panel unit root testing,Strauss | Lokale digitale Datei (pdf) | Digit. Objektsammlung | In house | Available | Place a Hold |