Shortfalls of panel unit root testing / Jack Strauss ; Taner Yigit

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Bibliographic Details
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Place / Publishing House:Amsterdam [u.a.] : Elsevier, 2003
Year of Publication:2003
Language:English
Physical Description:S. [309] - 313
Notes:
  • Literaturverz. S. 312 - 313
  • Aus: Economics letters ; 81.2003
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Description
ac_no:AC09578087
Hierarchical level:Monograph
Statement of Responsibility: Jack Strauss ; Taner Yigit