Defect analysis in electron microscopy

Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman

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Superior document:Science paperbacks 121
VerfasserIn:
Loretto, M. H.
Smallman, R. E.
Place / Publishing House:London [u.a.] : Chapman and Hall, 1975
Year of Publication:1975
Edition:1. publ.
Language:English
Series:Science paperbacks 121
A Halstead Press Book
Physical Description:IX, 134 S.; Ill., graph. Darst.; 23 cm
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id 990000643130504498
ctrlnum AC03186233
(AT-OBV)AC03186233
(Aleph)003181341ACC01
(DE-599)OBVAC03186233
(EXLNZ-43ACC_NETWORK)990031813410203331
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00908nam#a2200325zcb4500</leader><controlfield tag="001">990000643130504498</controlfield><controlfield tag="005">20230503184054.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">010509|1975####|||###########|||#|#eng#c</controlfield><controlfield tag="009">AC03186233</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">047054760X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0412137607</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0412137704</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(AT-OBV)AC03186233</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">AC03186233</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Aleph)003181341ACC01</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)OBVAC03186233</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLNZ-43ACC_NETWORK)990031813410203331</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MUL</subfield><subfield code="b">ger</subfield><subfield code="d">MUL</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="c">XA-GB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Loretto, M. H.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defect analysis in electron microscopy</subfield><subfield code="c">M. H. Loretto and R. E. Smallman</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. publ.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London [u.a.]</subfield><subfield code="b">Chapman and Hall</subfield><subfield code="c">1975</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 134 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield><subfield code="c">23 cm</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Science paperbacks</subfield><subfield code="v">121</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">A Halstead Press Book</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Smallman, R. E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="w">(AT-OBV)AC00052905</subfield><subfield code="v">121</subfield></datafield><datafield tag="970" ind1="1" ind2=" "><subfield code="c">37</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-05-03 18:40:54 Europe/Vienna</subfield><subfield code="d">20</subfield><subfield code="f">System</subfield><subfield code="c">marc21</subfield><subfield code="a">2018-12-24 09:47:47 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield></record></collection>
record_format marc
spelling Loretto, M. H. aut
Defect analysis in electron microscopy M. H. Loretto and R. E. Smallman
1. publ.
London [u.a.] Chapman and Hall 1975
IX, 134 S. Ill., graph. Darst. 23 cm
Science paperbacks 121
A Halstead Press Book
Smallman, R. E. aut
(AT-OBV)AC00052905 121
language English
format Book
author Loretto, M. H.
Smallman, R. E.
spellingShingle Loretto, M. H.
Smallman, R. E.
Defect analysis in electron microscopy
Science paperbacks
A Halstead Press Book
author_facet Loretto, M. H.
Smallman, R. E.
Smallman, R. E.
author_variant m h l mh mhl
r e s re res
author_role VerfasserIn
VerfasserIn
author2 Smallman, R. E.
author2_role VerfasserIn
author_sort Loretto, M. H.
title Defect analysis in electron microscopy
title_full Defect analysis in electron microscopy M. H. Loretto and R. E. Smallman
title_fullStr Defect analysis in electron microscopy M. H. Loretto and R. E. Smallman
title_full_unstemmed Defect analysis in electron microscopy M. H. Loretto and R. E. Smallman
title_auth Defect analysis in electron microscopy
title_new Defect analysis in electron microscopy
title_sort defect analysis in electron microscopy
series Science paperbacks
A Halstead Press Book
series2 Science paperbacks
A Halstead Press Book
publisher Chapman and Hall
publishDate 1975
physical IX, 134 S. Ill., graph. Darst. 23 cm
edition 1. publ.
isbn 047054760X
0412137607
0412137704
illustrated Illustrated
work_keys_str_mv AT lorettomh defectanalysisinelectronmicroscopy
AT smallmanre defectanalysisinelectronmicroscopy
status_str n
ids_txt_mv (AT-OBV)AC03186233
AC03186233
(Aleph)003181341ACC01
(DE-599)OBVAC03186233
(EXLNZ-43ACC_NETWORK)990031813410203331
hierarchy_parent_id AC00052905
hierarchy_parent_title Science paperbacks 121
hierarchy_sequence 121
is_hierarchy_id AC03186233
is_hierarchy_title Defect analysis in electron microscopy
container_title Science paperbacks 121
container_reference AC00052905
author2_original_writing_str_mv noLinkedField
_version_ 1787551400473919488

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