Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman
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| Superior document: | Science paperbacks 121 |
|---|---|
| VerfasserIn: | |
| Place / Publishing House: | London [u.a.] : Chapman and Hall, 1975 |
| Year of Publication: | 1975 |
| Edition: | 1. publ. |
| Language: | English |
| Series: | Science paperbacks
121 A Halstead Press Book |
| Physical Description: | IX, 134 S.; Ill., graph. Darst.; 23 cm |
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OeAW Erich Schmid Institute of Materials Science - ESI
| Location: | Library |
| Call Numbers: | ESI-600 |
| Call Number | 2nd Call Number | Description | Location | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| ESI-600 | ESI/UE | Library | Loan | Available | Place a Hold |