Rastermikroskopie in der Materialprüfung : Vorträge der 17. Tagung, 27. - 29. März 1996, Halle
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| Superior document: | DVM-Bericht 517 |
|---|---|
| MitwirkendeR: | |
| Place / Publishing House: | Berlin : DVM, 1996 |
| Year of Publication: | 1996 |
| Language: | German |
| Series: | DVM-Bericht
517 |
| Physical Description: | 366 S.; Ill., graph. Darst. |
| Notes: | Literaturangaben |
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Copies
OeAW Erich Schmid Institute of Materials Science - ESI
| Location: | Library |
| Call Numbers: | ESI-522 |
| Call Number | 2nd Call Number | Description | Location | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| ESI-522 | ESI/UE | Library | Loan | Available | Place a Hold |