Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
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| Superior document: | Artech House integrated microsystems series |
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| Year of Publication: | 2010 |
| Language: | English |
| Series: | Artech House integrated microsystems series.
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| Online Access: | |
| Physical Description: | xv, 198 p. :; ill. |
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