Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
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Superior document: | Artech House integrated microsystems series |
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Year of Publication: | 2010 |
Language: | English |
Series: | Artech House integrated microsystems series.
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Physical Description: | xv, 198 p. :; ill. |
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Bahukudumbi, Sudarshan. Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Boston : Artech House, 2010. xv, 198 p. : ill. Artech House integrated microsystems series Includes bibliographical references and index. Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Integrated circuits Testing. Integrated circuits Wafer-scale integration. Semiconductors Testing. Electronic books. Chakrabarty, Krishnendu. ProQuest (Firm) Artech House integrated microsystems series. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=946559 Click to View |
language |
English |
format |
Electronic eBook |
author |
Bahukudumbi, Sudarshan. |
spellingShingle |
Bahukudumbi, Sudarshan. Wafer-level testing and test during burn-in for integrated circuits Artech House integrated microsystems series |
author_facet |
Bahukudumbi, Sudarshan. Chakrabarty, Krishnendu. ProQuest (Firm) ProQuest (Firm) |
author_variant |
s b sb |
author2 |
Chakrabarty, Krishnendu. ProQuest (Firm) |
author2_variant |
k c kc |
author2_role |
TeilnehmendeR TeilnehmendeR |
author_corporate |
ProQuest (Firm) |
author_sort |
Bahukudumbi, Sudarshan. |
title |
Wafer-level testing and test during burn-in for integrated circuits |
title_full |
Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty. |
title_fullStr |
Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty. |
title_full_unstemmed |
Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty. |
title_auth |
Wafer-level testing and test during burn-in for integrated circuits |
title_new |
Wafer-level testing and test during burn-in for integrated circuits |
title_sort |
wafer-level testing and test during burn-in for integrated circuits |
series |
Artech House integrated microsystems series |
series2 |
Artech House integrated microsystems series |
publisher |
Artech House, |
publishDate |
2010 |
physical |
xv, 198 p. : ill. |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7874 |
callnumber-sort |
TK 47874 B35 42010 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=946559 |
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Illustrated |
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600 - Technology |
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620 - Engineering |
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621 - Applied physics |
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621.38132 |
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3621.38132 |
dewey-raw |
621.38132 |
dewey-search |
621.38132 |
oclc_num |
796382946 |
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(MiAaPQ)500946559 (Au-PeEL)EBL946559 (CaPaEBR)ebr10412729 (OCoLC)796382946 |
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Artech House integrated microsystems series |
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Wafer-level testing and test during burn-in for integrated circuits |
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Artech House integrated microsystems series |
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