Wafer-level testing and test during burn-in for integrated circuits

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

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Superior document:Artech House integrated microsystems series
:
ProQuest (Firm)
Bahukudumbi, Sudarshan.
TeilnehmendeR:
Chakrabarty, Krishnendu.
ProQuest (Firm)
Year of Publication:2010
Language:English
Series:Artech House integrated microsystems series.
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Physical Description:xv, 198 p. :; ill.
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record_format marc
spelling Bahukudumbi, Sudarshan.
Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
Boston : Artech House, 2010.
xv, 198 p. : ill.
Artech House integrated microsystems series
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Integrated circuits Testing.
Integrated circuits Wafer-scale integration.
Semiconductors Testing.
Electronic books.
Chakrabarty, Krishnendu.
ProQuest (Firm)
Artech House integrated microsystems series.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=946559 Click to View
language English
format Electronic
eBook
author Bahukudumbi, Sudarshan.
spellingShingle Bahukudumbi, Sudarshan.
Wafer-level testing and test during burn-in for integrated circuits
Artech House integrated microsystems series
author_facet Bahukudumbi, Sudarshan.
Chakrabarty, Krishnendu.
ProQuest (Firm)
ProQuest (Firm)
author_variant s b sb
author2 Chakrabarty, Krishnendu.
ProQuest (Firm)
author2_variant k c kc
author2_role TeilnehmendeR
TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Bahukudumbi, Sudarshan.
title Wafer-level testing and test during burn-in for integrated circuits
title_full Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
title_fullStr Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
title_full_unstemmed Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
title_auth Wafer-level testing and test during burn-in for integrated circuits
title_new Wafer-level testing and test during burn-in for integrated circuits
title_sort wafer-level testing and test during burn-in for integrated circuits
series Artech House integrated microsystems series
series2 Artech House integrated microsystems series
publisher Artech House,
publishDate 2010
physical xv, 198 p. : ill.
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7874
callnumber-sort TK 47874 B35 42010
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=946559
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.38132
dewey-sort 3621.38132
dewey-raw 621.38132
dewey-search 621.38132
oclc_num 796382946
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