Nonlinear transistor model parameter extraction techniques / edited by Matthias Rudolph, Christian Fager, David E. Root.

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Bibliographic Details
Superior document:The Cambridge RF and microwave engineering series
:
TeilnehmendeR:
Year of Publication:2012
Language:English
Series:Cambridge RF and microwave engineering series.
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Physical Description:xiv, 352 p. :; ill.
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