Nonlinear transistor model parameter extraction techniques

Nonlinear transistor model parameter extraction techniques / edited by Matthias Rudolph, Christian Fager, David E. Root.

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Bibliographic Details
Superior document:The Cambridge RF and microwave engineering series
:
ProQuest (Firm)
TeilnehmendeR:
Fager, Christian.
Root, David E.
Rudolph, Matthias, 1969-
ProQuest (Firm)
Year of Publication:2012
Language:English
Series:Cambridge RF and microwave engineering series.
Online Access:
Physical Description:xiv, 352 p. :; ill.
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245 0 0 |a Nonlinear transistor model parameter extraction techniques  |h [electronic resource] /  |c edited by Matthias Rudolph, Christian Fager, David E. Root. 
260 |a Cambridge ;  |a New York :  |b Cambridge University Press,  |c c2012. 
300 |a xiv, 352 p. :  |b ill. 
490 1 |a The Cambridge RF and microwave engineering series 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Transistors  |x Mathematical models. 
650 0 |a Electronic circuit design. 
655 4 |a Electronic books. 
700 1 |a Fager, Christian. 
700 1 |a Root, David E. 
700 1 |a Rudolph, Matthias,  |d 1969- 
710 2 |a ProQuest (Firm) 
830 0 |a Cambridge RF and microwave engineering series. 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=807153  |z Click to View 

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