Nonlinear transistor model parameter extraction techniques / edited by Matthias Rudolph, Christian Fager, David E. Root.
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Superior document: | The Cambridge RF and microwave engineering series |
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Year of Publication: | 2012 |
Language: | English |
Series: | Cambridge RF and microwave engineering series.
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Online Access: | |
Physical Description: | xiv, 352 p. :; ill. |
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Bibliography: | Includes bibliographical references and index. |
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ISBN: | 9780521762106 (hardback) 9781139157445 (electronic bk.) |
Hierarchical level: | Monograph |
Statement of Responsibility: | edited by Matthias Rudolph, Christian Fager, David E. Root. |