GaN HEMT modeling including trapping effects based on Chalmers model and pulsed S-parameter measurements /

GaN HEMT modeling including trapping effects based on Chalmers model and pulsed S-parameter measurements / / vorgelegt von Peng Luo.

Kaydedildi:
Detaylı Bibliyografya
VerfasserIn:
Luo, Peng,
Place / Publishing House:Gottingen : : Cuvillier Verlag,, 2018.
Yayın Tarihi:2018
Dil:English
Online Erişim:
Fiziksel Özellikler:1 online resource (160 pages)
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!
Diğer Bilgiler
ISBN:9783736999060
9783736989061 (ebook)
Hierarchical level:Monograph
Statement of Responsibility: vorgelegt von Peng Luo.

Benzer Materyaller