Design for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
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Superior document: | Frontiers in electronic testing |
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TeilnehmendeR: | |
Year of Publication: | 2000 |
Language: | English |
Series: | Frontiers in electronic testing.
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Online Access: | |
Physical Description: | xvii, 239 p. :; ill. |
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5003035636 |
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Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. Boston : Kluwer Academic, c2000. xvii, 239 p. : ill. Frontiers in electronic testing Includes bibliographical references. Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Integrated circuits Testing. Electronic apparatus and appliances Testing. Electronic books. Nadeau-Dostie, Benoit. ProQuest (Firm) Frontiers in electronic testing. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3035636 Click to View |
language |
English |
format |
Electronic eBook |
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Nadeau-Dostie, Benoit. ProQuest (Firm) |
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Nadeau-Dostie, Benoit. ProQuest (Firm) ProQuest (Firm) |
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TeilnehmendeR TeilnehmendeR |
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ProQuest (Firm) |
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Nadeau-Dostie, Benoit. |
title |
Design for at-speed test, diagnosis, and measurement |
spellingShingle |
Design for at-speed test, diagnosis, and measurement Frontiers in electronic testing |
title_full |
Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. |
title_fullStr |
Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. |
title_full_unstemmed |
Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. |
title_auth |
Design for at-speed test, diagnosis, and measurement |
title_new |
Design for at-speed test, diagnosis, and measurement |
title_sort |
design for at-speed test, diagnosis, and measurement |
series |
Frontiers in electronic testing |
series2 |
Frontiers in electronic testing |
publisher |
Kluwer Academic, |
publishDate |
2000 |
physical |
xvii, 239 p. : ill. |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7874 |
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TK 47874 D47497 42000 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
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https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3035636 |
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Illustrated |
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600 - Technology |
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620 - Engineering |
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621 - Applied physics |
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621.385 |
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3621.385 |
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621.385 |
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621.385 |
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923696405 |
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AT nadeaudostiebenoit designforatspeedtestdiagnosisandmeasurement AT proquestfirm designforatspeedtestdiagnosisandmeasurement |
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(MiAaPQ)5003035636 (Au-PeEL)EBL3035636 (CaPaEBR)ebr10052637 (CaONFJC)MIL20031 (OCoLC)923696405 |
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Frontiers in electronic testing |
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Design for at-speed test, diagnosis, and measurement |
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Frontiers in electronic testing |
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