Design for at-speed test, diagnosis, and measurement

Design for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.

Saved in:
Bibliographic Details
Superior document:Frontiers in electronic testing
:
ProQuest (Firm)
TeilnehmendeR:
Nadeau-Dostie, Benoit.
ProQuest (Firm)
Year of Publication:2000
Language:English
Series:Frontiers in electronic testing.
Online Access:
Physical Description:xvii, 239 p. :; ill.
Tags: Add Tag
No Tags, Be the first to tag this record!
id 5003035636
ctrlnum (MiAaPQ)5003035636
(Au-PeEL)EBL3035636
(CaPaEBR)ebr10052637
(CaONFJC)MIL20031
(OCoLC)923696405
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01397nam a22003734a 4500</leader><controlfield tag="001">5003035636</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">990817s2000 maua sb 000 0 eng </controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 99046022 </subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">0792386698 (alk. paper)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5003035636</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL3035636</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10052637</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL20031</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)923696405</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7874</subfield><subfield code="b">.D47497 2000</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">621.385</subfield><subfield code="2">21</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Design for at-speed test, diagnosis, and measurement</subfield><subfield code="h">[electronic resource] /</subfield><subfield code="c">edited by Benoit Nadeau-Dostie.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Boston :</subfield><subfield code="b">Kluwer Academic,</subfield><subfield code="c">c2000.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvii, 239 p. :</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nadeau-Dostie, Benoit.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in electronic testing.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3035636</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>
record_format marc
spelling Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
Boston : Kluwer Academic, c2000.
xvii, 239 p. : ill.
Frontiers in electronic testing
Includes bibliographical references.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Integrated circuits Testing.
Electronic apparatus and appliances Testing.
Electronic books.
Nadeau-Dostie, Benoit.
ProQuest (Firm)
Frontiers in electronic testing.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3035636 Click to View
language English
format Electronic
eBook
author2 Nadeau-Dostie, Benoit.
ProQuest (Firm)
author_facet Nadeau-Dostie, Benoit.
ProQuest (Firm)
ProQuest (Firm)
author2_variant b n d bnd
author2_role TeilnehmendeR
TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Nadeau-Dostie, Benoit.
title Design for at-speed test, diagnosis, and measurement
spellingShingle Design for at-speed test, diagnosis, and measurement
Frontiers in electronic testing
title_full Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
title_fullStr Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
title_full_unstemmed Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
title_auth Design for at-speed test, diagnosis, and measurement
title_new Design for at-speed test, diagnosis, and measurement
title_sort design for at-speed test, diagnosis, and measurement
series Frontiers in electronic testing
series2 Frontiers in electronic testing
publisher Kluwer Academic,
publishDate 2000
physical xvii, 239 p. : ill.
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7874
callnumber-sort TK 47874 D47497 42000
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3035636
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.385
dewey-sort 3621.385
dewey-raw 621.385
dewey-search 621.385
oclc_num 923696405
work_keys_str_mv AT nadeaudostiebenoit designforatspeedtestdiagnosisandmeasurement
AT proquestfirm designforatspeedtestdiagnosisandmeasurement
status_str n
ids_txt_mv (MiAaPQ)5003035636
(Au-PeEL)EBL3035636
(CaPaEBR)ebr10052637
(CaONFJC)MIL20031
(OCoLC)923696405
hierarchy_parent_title Frontiers in electronic testing
is_hierarchy_title Design for at-speed test, diagnosis, and measurement
container_title Frontiers in electronic testing
author2_original_writing_str_mv noLinkedField
noLinkedField
_version_ 1792330835244875777

Similar Items