Design for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.

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Bibliographic Details
Superior document:Frontiers in electronic testing
:
TeilnehmendeR:
Year of Publication:2000
Language:English
Series:Frontiers in electronic testing.
Online Access:
Physical Description:xvii, 239 p. :; ill.
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245 0 0 |a Design for at-speed test, diagnosis, and measurement  |h [electronic resource] /  |c edited by Benoit Nadeau-Dostie. 
260 |a Boston :  |b Kluwer Academic,  |c c2000. 
300 |a xvii, 239 p. :  |b ill. 
490 1 |a Frontiers in electronic testing 
504 |a Includes bibliographical references. 
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Integrated circuits  |x Testing. 
650 0 |a Electronic apparatus and appliances  |x Testing. 
655 4 |a Electronic books. 
700 1 |a Nadeau-Dostie, Benoit. 
710 2 |a ProQuest (Firm) 
830 0 |a Frontiers in electronic testing. 
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