Design for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
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Superior document: | Frontiers in electronic testing |
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TeilnehmendeR: | |
Year of Publication: | 2000 |
Language: | English |
Series: | Frontiers in electronic testing.
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Online Access: | |
Physical Description: | xvii, 239 p. :; ill. |
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LEADER | 01397nam a22003734a 4500 | ||
---|---|---|---|
001 | 5003035636 | ||
003 | MiAaPQ | ||
005 | 20200520144314.0 | ||
006 | m o d | | ||
007 | cr cn||||||||| | ||
008 | 990817s2000 maua sb 000 0 eng | ||
010 | |z 99046022 | ||
020 | |z 0792386698 (alk. paper) | ||
035 | |a (MiAaPQ)5003035636 | ||
035 | |a (Au-PeEL)EBL3035636 | ||
035 | |a (CaPaEBR)ebr10052637 | ||
035 | |a (CaONFJC)MIL20031 | ||
035 | |a (OCoLC)923696405 | ||
040 | |a MiAaPQ |c MiAaPQ |d MiAaPQ | ||
050 | 4 | |a TK7874 |b .D47497 2000 | |
082 | 0 | 4 | |a 621.385 |2 21 |
245 | 0 | 0 | |a Design for at-speed test, diagnosis, and measurement |h [electronic resource] / |c edited by Benoit Nadeau-Dostie. |
260 | |a Boston : |b Kluwer Academic, |c c2000. | ||
300 | |a xvii, 239 p. : |b ill. | ||
490 | 1 | |a Frontiers in electronic testing | |
504 | |a Includes bibliographical references. | ||
533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 | |a Integrated circuits |x Testing. | |
650 | 0 | |a Electronic apparatus and appliances |x Testing. | |
655 | 4 | |a Electronic books. | |
700 | 1 | |a Nadeau-Dostie, Benoit. | |
710 | 2 | |a ProQuest (Firm) | |
830 | 0 | |a Frontiers in electronic testing. | |
856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3035636 |z Click to View |