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Auger electron spectroscopy : : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme.

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Superior document:	Materials characterization and analysis collection
VerfasserIn:	Wolstenholme, John,
Place / Publishing House:	New York, New York : : Momentum Press, LLC,, [2015] 2015
Year of Publication:	2015
Language:	English
Series:	Materials characterization and analysis collection.
Online Access:	https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2095627
Physical Description:	1 online resource (xxvi, 224 pages) :; illustrations.
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id	5002095627
ctrlnum	(MiAaPQ)5002095627 (Au-PeEL)EBL2095627 (CaPaEBR)ebr11078099 (CaONFJC)MIL813360 (OCoLC)914432297
collection	bib_alma
record_format	marc
spelling	Wolstenholme, John, author. Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / John Wolstenholme. New York, New York : Momentum Press, LLC, [2015] 2015 1 online resource (xxvi, 224 pages) : illustrations. text txt rdacontent computer c rdamedia online resource cr rdacarrier Materials characterization and analysis collection Description based on print version record. Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Electron spectroscopy. Electronic books. Print version: Wolstenholme, John. Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films. New York, New York : Momentum Press, LLC, c2015 xxvi, 224 pages Materials characterization and analysis collection. 9781606506813 ProQuest (Firm) Materials characterization and analysis collection. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2095627 Click to View
language	English
format	eBook
author	Wolstenholme, John,
spellingShingle	Wolstenholme, John, Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / Materials characterization and analysis collection
author_facet	Wolstenholme, John,
author_variant	j w jw
author_role	VerfasserIn
author_sort	Wolstenholme, John,
title	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /
title_sub	practical application to materials analysis and characterization of surfaces, interfaces, and thin films /
title_full	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / John Wolstenholme.
title_fullStr	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / John Wolstenholme.
title_full_unstemmed	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / John Wolstenholme.
title_auth	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /
title_new	Auger electron spectroscopy :
title_sort	auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /
series	Materials characterization and analysis collection
series2	Materials characterization and analysis collection
publisher	Momentum Press, LLC,
publishDate	2015
physical	1 online resource (xxvi, 224 pages) : illustrations.
isbn	9781606506820 9781606506813
callnumber-first	Q - Science
callnumber-subject	QC - Physics
callnumber-label	QC454
callnumber-sort	QC 3454 E4 W657 42015
genre	Electronic books.
genre_facet	Electronic books.
url	https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2095627
illustrated	Illustrated
dewey-hundreds	500 - Science
dewey-tens	540 - Chemistry
dewey-ones	543 - Analytical chemistry
dewey-full	543.0858
dewey-sort	3543.0858
dewey-raw	543.0858
dewey-search	543.0858
oclc_num	914432297
work_keys_str_mv	AT wolstenholmejohn augerelectronspectroscopypracticalapplicationtomaterialsanalysisandcharacterizationofsurfacesinterfacesandthinfilms
status_str	n
ids_txt_mv	(MiAaPQ)5002095627 (Au-PeEL)EBL2095627 (CaPaEBR)ebr11078099 (CaONFJC)MIL813360 (OCoLC)914432297
carrierType_str_mv	cr
hierarchy_parent_title	Materials characterization and analysis collection
is_hierarchy_title	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /
container_title	Materials characterization and analysis collection
_version_	1792330824764358656
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01969nam a2200421 i 4500</leader><controlfield tag="001">5002095627</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d \| </controlfield><controlfield tag="007">cr cnu\|\|\|\|\|\|\|\|</controlfield><controlfield tag="008">181229s2015 nyua o 000 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781606506813</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781606506820</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5002095627</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL2095627</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr11078099</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL813360</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)914432297</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QC454.E4</subfield><subfield code="b">.W657 2015</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">543.0858</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wolstenholme, John,</subfield><subfield code="e">author.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Auger electron spectroscopy :</subfield><subfield code="b">practical application to materials analysis and characterization of surfaces, interfaces, and thin films /</subfield><subfield code="c">John Wolstenholme.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, New York :</subfield><subfield code="b">Momentum Press, LLC,</subfield><subfield code="c">[2015]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xxvi, 224 pages) :</subfield><subfield code="b">illustrations.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials characterization and analysis collection</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on print version record.</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electron spectroscopy.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Wolstenholme, John.</subfield><subfield code="t">Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films.</subfield><subfield code="d">New York, New York : Momentum Press, LLC, c2015 </subfield><subfield code="h">xxvi, 224 pages </subfield><subfield code="k">Materials characterization and analysis collection.</subfield><subfield code="z">9781606506813</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials characterization and analysis collection.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2095627</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>

Auger electron spectroscopy : : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme.

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