Auger electron spectroscopy : : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme.

Saved in:
Bibliographic Details
Superior document:Materials characterization and analysis collection
VerfasserIn:
Place / Publishing House:New York, New York : : Momentum Press, LLC,, [2015]
2015
Year of Publication:2015
Language:English
Series:Materials characterization and analysis collection.
Online Access:
Physical Description:1 online resource (xxvi, 224 pages) :; illustrations.
Tags: Add Tag
No Tags, Be the first to tag this record!
LEADER 01969nam a2200421 i 4500
001 5002095627
003 MiAaPQ
005 20200520144314.0
006 m o d |
007 cr cnu||||||||
008 181229s2015 nyua o 000 0 eng d
020 |z 9781606506813 
020 |a 9781606506820  |q (electronic bk.) 
035 |a (MiAaPQ)5002095627 
035 |a (Au-PeEL)EBL2095627 
035 |a (CaPaEBR)ebr11078099 
035 |a (CaONFJC)MIL813360 
035 |a (OCoLC)914432297 
040 |a MiAaPQ  |b eng  |e rda  |e pn  |c MiAaPQ  |d MiAaPQ 
050 4 |a QC454.E4  |b .W657 2015 
082 0 |a 543.0858  |2 23 
100 1 |a Wolstenholme, John,  |e author. 
245 1 0 |a Auger electron spectroscopy :  |b practical application to materials analysis and characterization of surfaces, interfaces, and thin films /  |c John Wolstenholme. 
264 1 |a New York, New York :  |b Momentum Press, LLC,  |c [2015] 
264 4 |c 2015 
300 |a 1 online resource (xxvi, 224 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Materials characterization and analysis collection 
588 |a Description based on print version record. 
590 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Electron spectroscopy. 
655 4 |a Electronic books. 
776 0 8 |i Print version:  |a Wolstenholme, John.  |t Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films.  |d New York, New York : Momentum Press, LLC, c2015   |h xxvi, 224 pages   |k Materials characterization and analysis collection.  |z 9781606506813 
797 2 |a ProQuest (Firm) 
830 0 |a Materials characterization and analysis collection. 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2095627  |z Click to View