Auger electron spectroscopy : : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme.
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| Superior document: | Materials characterization and analysis collection |
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| VerfasserIn: | |
| Place / Publishing House: | New York, New York : : Momentum Press, LLC,, [2015] 2015 |
| Year of Publication: | 2015 |
| Language: | English |
| Series: | Materials characterization and analysis collection.
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| Online Access: | |
| Physical Description: | 1 online resource (xxvi, 224 pages) :; illustrations. |
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