Electrical overstress (EOS) : devices, circuits and systems / / Steven H. Voldman.
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
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| Year of Publication: | 2014 |
| Language: | English |
| Series: | ESD series
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| Online Access: | |
| Physical Description: | xxiv, 344 p. :; ill. |
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