Advanced Interconnect and Packaging / / Wensheng Zhao, editor.

Unlike transistors, the continuous downscaling of feature size in CMOS technology leads to a dramatic rise in interconnect resistivity and concomitant performance degradation. At nanoscale technology nodes, interconnect delay and reliability become the major bottlenecks faced by modern integrated ci...

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Place / Publishing House:Basel : : MDPI - Multidisciplinary Digital Publishing Institute,, 2023.
Year of Publication:2023
Language:English
Physical Description:1 online resource (266 pages)
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DOAB Directory of Open Access Books Available
DOAB Directory of Open Access Books Available