Photonic Technology for Precision Metrology
Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon–matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared ra...
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Wojtas, Jacek edt Photonic Technology for Precision Metrology Basel MDPI - Multidisciplinary Digital Publishing Institute 2022 1 electronic resource (126 p.) text txt rdacontent computer c rdamedia online resource cr rdacarrier Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon–matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared range. Since the invention of the laser, a source of highly coherent optical radiation, optical measurements have become the perfect tool for highly precise and accurate measurements. Such measurements have the additional advantages of requiring no contact and a fast rate suitable for in-process metrology. However, their extreme precision is ultimately limited by, e.g., the noise of both lasers and photodetectors. The Special Issue of the Applied Science is devoted to the cutting-edge uses of optical sources, detectors, and optoelectronics systems in numerous fields of science and technology (e.g., industry, environment, healthcare, telecommunication, security, and space). The aim is to provide detail on state-of-the-art photonic technology for precision metrology and identify future developmental directions. This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems. English Technology: general issues bicssc History of engineering & technology bicssc infrared thermometer mid-wave infrared indium arsenide antimony photodiode uncooled thermometer fibreoptic coupling chopper stabilised op-amp zero-drift pre-amplifier ammonia detection NH3 MOX sensors polymer sensors laser absorption spectroscopy CRDS CEAS MUPASS PAS HOT IR detectors HgCdTe P-i-N BLIP condition 2D material photodetectors colloidal quantum dot photodetectors low-light photodetectors fluorescence microscopy time-resolved fluorescence microscopy hybrid photodetector (HPD) single-molecule fluorescence detection fourier ptychography image classification deep learning neural network electro-optic modulator frequency modulation displacement measuring interferometer quantum cascade laser laser controller infrared modulator laser spectroscopy free space optics photonic metrology accuracy precision resolution FTIR absorption spectroscopy gas sensors optoelectronic sensors 3-0365-4493-3 3-0365-4494-1 Wojtas, Jacek oth |
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English |
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Wojtas, Jacek |
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Wojtas, Jacek |
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Photonic Technology for Precision Metrology |
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Photonic Technology for Precision Metrology |
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Photonic Technology for Precision Metrology |
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Photonic Technology for Precision Metrology |
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Photonic Technology for Precision Metrology |
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Photonic Technology for Precision Metrology |
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Photonic Technology for Precision Metrology |
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photonic technology for precision metrology |
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MDPI - Multidisciplinary Digital Publishing Institute |
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2022 |
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1 electronic resource (126 p.) |
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3-0365-4493-3 3-0365-4494-1 |
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AT wojtasjacek photonictechnologyforprecisionmetrology |
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(CKB)5600000000483102 (oapen)https://directory.doabooks.org/handle/20.500.12854/91158 (EXLCZ)995600000000483102 |
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Photonic Technology for Precision Metrology |
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_version_ |
1787548435029688320 |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03861nam-a2200865z--4500</leader><controlfield tag="001">993553547804498</controlfield><controlfield tag="005">20231214132936.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr|mn|---annan</controlfield><controlfield tag="008">202208s2022 xx |||||o ||| 0|eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)5600000000483102</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(oapen)https://directory.doabooks.org/handle/20.500.12854/91158</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)995600000000483102</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wojtas, Jacek</subfield><subfield code="4">edt</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Photonic Technology for Precision Metrology</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Basel</subfield><subfield code="b">MDPI - Multidisciplinary Digital Publishing Institute</subfield><subfield code="c">2022</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 electronic resource (126 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon–matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared range. Since the invention of the laser, a source of highly coherent optical radiation, optical measurements have become the perfect tool for highly precise and accurate measurements. Such measurements have the additional advantages of requiring no contact and a fast rate suitable for in-process metrology. However, their extreme precision is ultimately limited by, e.g., the noise of both lasers and photodetectors. The Special Issue of the Applied Science is devoted to the cutting-edge uses of optical sources, detectors, and optoelectronics systems in numerous fields of science and technology (e.g., industry, environment, healthcare, telecommunication, security, and space). The aim is to provide detail on state-of-the-art photonic technology for precision metrology and identify future developmental directions. This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">English</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Technology: general issues</subfield><subfield code="2">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">History of engineering & technology</subfield><subfield code="2">bicssc</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">infrared thermometer</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">mid-wave infrared</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">indium arsenide antimony photodiode</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">uncooled thermometer</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">fibreoptic coupling</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">chopper stabilised op-amp</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">zero-drift pre-amplifier</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">ammonia detection</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">NH3</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">MOX sensors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">polymer sensors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">laser absorption spectroscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">CRDS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">CEAS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">MUPASS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">PAS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">HOT IR detectors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">HgCdTe</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">P-i-N</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">BLIP condition</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">2D material photodetectors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">colloidal quantum dot photodetectors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">low-light photodetectors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">fluorescence microscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">time-resolved fluorescence microscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">hybrid photodetector (HPD)</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">single-molecule fluorescence detection</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">fourier ptychography</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">image classification</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">deep learning</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">neural network</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">electro-optic modulator</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">frequency modulation</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">displacement measuring interferometer</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">quantum cascade laser</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">laser controller</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">infrared modulator</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">laser spectroscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">free space optics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">photonic metrology</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">accuracy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">precision</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">resolution</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">FTIR</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">absorption spectroscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">gas sensors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">optoelectronic sensors</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">3-0365-4493-3</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">3-0365-4494-1</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wojtas, Jacek</subfield><subfield code="4">oth</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">BOOK</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-12-15 05:36:46 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2022-08-13 21:17:26 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="i">DOAB Directory of Open Access Books</subfield><subfield code="P">DOAB Directory of Open Access Books</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&portfolio_pid=5339474150004498&Force_direct=true</subfield><subfield code="Z">5339474150004498</subfield><subfield code="b">Available</subfield><subfield code="8">5339474150004498</subfield></datafield></record></collection> |