Photonic Technology for Precision Metrology

Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon–matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared ra...

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Year of Publication:2022
Language:English
Physical Description:1 electronic resource (126 p.)
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spelling Wojtas, Jacek edt
Photonic Technology for Precision Metrology
Basel MDPI - Multidisciplinary Digital Publishing Institute 2022
1 electronic resource (126 p.)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Photonics has had a decisive influence on recent scientific and technological achievements. It includes aspects of photon generation and photon–matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operate in the visible and infrared range. Since the invention of the laser, a source of highly coherent optical radiation, optical measurements have become the perfect tool for highly precise and accurate measurements. Such measurements have the additional advantages of requiring no contact and a fast rate suitable for in-process metrology. However, their extreme precision is ultimately limited by, e.g., the noise of both lasers and photodetectors. The Special Issue of the Applied Science is devoted to the cutting-edge uses of optical sources, detectors, and optoelectronics systems in numerous fields of science and technology (e.g., industry, environment, healthcare, telecommunication, security, and space). The aim is to provide detail on state-of-the-art photonic technology for precision metrology and identify future developmental directions. This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems.
English
Technology: general issues bicssc
History of engineering & technology bicssc
infrared thermometer
mid-wave infrared
indium arsenide antimony photodiode
uncooled thermometer
fibreoptic coupling
chopper stabilised op-amp
zero-drift pre-amplifier
ammonia detection
NH3
MOX sensors
polymer sensors
laser absorption spectroscopy
CRDS
CEAS
MUPASS
PAS
HOT IR detectors
HgCdTe
P-i-N
BLIP condition
2D material photodetectors
colloidal quantum dot photodetectors
low-light photodetectors
fluorescence microscopy
time-resolved fluorescence microscopy
hybrid photodetector (HPD)
single-molecule fluorescence detection
fourier ptychography
image classification
deep learning
neural network
electro-optic modulator
frequency modulation
displacement measuring interferometer
quantum cascade laser
laser controller
infrared modulator
laser spectroscopy
free space optics
photonic metrology
accuracy
precision
resolution
FTIR
absorption spectroscopy
gas sensors
optoelectronic sensors
3-0365-4493-3
3-0365-4494-1
Wojtas, Jacek oth
language English
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author_facet Wojtas, Jacek
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title Photonic Technology for Precision Metrology
spellingShingle Photonic Technology for Precision Metrology
title_full Photonic Technology for Precision Metrology
title_fullStr Photonic Technology for Precision Metrology
title_full_unstemmed Photonic Technology for Precision Metrology
title_auth Photonic Technology for Precision Metrology
title_new Photonic Technology for Precision Metrology
title_sort photonic technology for precision metrology
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2022
physical 1 electronic resource (126 p.)
isbn 3-0365-4493-3
3-0365-4494-1
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