Semiconductor packaging : : materials interaction and reliability / / Andrea Chen, Randy Hsiao-Yu Lo.

In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the...

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Place / Publishing House:Boca Raton, Fla. : : CRC Press,, 2012.
Year of Publication:2012
Edition:1st edition
Language:English
Physical Description:1 online resource (208 p.)
Notes:Description based upon print version of record.
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spelling Chen, Andrea., author.
Semiconductor packaging : materials interaction and reliability / Andrea Chen, Randy Hsiao-Yu Lo.
1st edition
Boca Raton, Fla. : CRC Press, 2012.
1 online resource (208 p.)
text txt
computer c
online resource cr
text file
Description based upon print version of record.
Front Cover; Contents; Preface; Authors; Partial list of abbreviations, acronyms, and symbols; Chapter 1: History and background; Chapter 2: Package form factors and families; Chapter 3: Surface-mount technology; Chapter 4: Other packaging needs; Chapter 5: Reliability testing; Chapter 6: Polymers; Chapter 7: Metals; Chapter 8: Ceramics and glasses; Chapter 9: Trends and challenges; Chapter 10: Light-emitting diodes; Glossary; Appendix A: Analytical tools; Appendix B: Destructive tools and tests; Back Cover
English
Includes bibliographical references.
In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package. The book focuses on an important step in semiconductor manufacturing package assembly and testing. It covers the basics of material properties and explains how to determine which behaviors are important to package performance. The authors also discuss how the properties of packaging materials interact with each another and explore how to maximize the performance of these materials in regard to package integrity and reliability.By tying together the disparate elements essential to a semiconductor package, this easy-to-read book shows how all the parts fit and work together to provide durable protection for the integrated circuit chip within as well as a means for the chip to communicate with the outside world-- Provided by publisher.
Semiconductors Reliability.
Electronic packaging Reliability.
Materials science.
Electrical engineering.
1-138-07540-X
1-4398-6205-2
Lo, Randy.
language English
format eBook
author Chen, Andrea.,
spellingShingle Chen, Andrea.,
Semiconductor packaging : materials interaction and reliability /
Front Cover; Contents; Preface; Authors; Partial list of abbreviations, acronyms, and symbols; Chapter 1: History and background; Chapter 2: Package form factors and families; Chapter 3: Surface-mount technology; Chapter 4: Other packaging needs; Chapter 5: Reliability testing; Chapter 6: Polymers; Chapter 7: Metals; Chapter 8: Ceramics and glasses; Chapter 9: Trends and challenges; Chapter 10: Light-emitting diodes; Glossary; Appendix A: Analytical tools; Appendix B: Destructive tools and tests; Back Cover
author_facet Chen, Andrea.,
Lo, Randy.
author_variant a c ac
author_role VerfasserIn
author2 Lo, Randy.
author2_variant r l rl
author2_role TeilnehmendeR
author_sort Chen, Andrea.,
title Semiconductor packaging : materials interaction and reliability /
title_sub materials interaction and reliability /
title_full Semiconductor packaging : materials interaction and reliability / Andrea Chen, Randy Hsiao-Yu Lo.
title_fullStr Semiconductor packaging : materials interaction and reliability / Andrea Chen, Randy Hsiao-Yu Lo.
title_full_unstemmed Semiconductor packaging : materials interaction and reliability / Andrea Chen, Randy Hsiao-Yu Lo.
title_auth Semiconductor packaging : materials interaction and reliability /
title_new Semiconductor packaging :
title_sort semiconductor packaging : materials interaction and reliability /
publisher CRC Press,
publishDate 2012
physical 1 online resource (208 p.)
edition 1st edition
contents Front Cover; Contents; Preface; Authors; Partial list of abbreviations, acronyms, and symbols; Chapter 1: History and background; Chapter 2: Package form factors and families; Chapter 3: Surface-mount technology; Chapter 4: Other packaging needs; Chapter 5: Reliability testing; Chapter 6: Polymers; Chapter 7: Metals; Chapter 8: Ceramics and glasses; Chapter 9: Trends and challenges; Chapter 10: Light-emitting diodes; Glossary; Appendix A: Analytical tools; Appendix B: Destructive tools and tests; Back Cover
isbn 1-000-21861-9
0-429-06335-0
1-283-27460-4
9786613274601
1-4398-6207-9
1-138-07540-X
1-4398-6205-2
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7871
callnumber-sort TK 47871.85 S4675 42011
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.38152
dewey-sort 3621.38152
dewey-raw 621.38152
dewey-search 621.38152
oclc_num 756484227
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