Atomic-force Microscopy and Its Applications / / edited by Tomasz Tański, Marcin Staszuk, and Bogusław Ziębowicz.
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as sp...
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| Place / Publishing House: | London, United Kingdom : : IntechOpen,, 2019. |
| Year of Publication: | 2019 |
| Language: | English |
| Physical Description: | 1 online resource (114 pages) :; illustrations some color |
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