Atomic-force Microscopy and Its Applications / / edited by Tomasz Tański, Marcin Staszuk, and Bogusław Ziębowicz.
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as sp...
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| Place / Publishing House: | London, United Kingdom : : IntechOpen,, 2019. |
| Year of Publication: | 2019 |
| Language: | English |
| Physical Description: | 1 online resource (114 pages) :; illustrations some color |
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(CKB)4970000000100431 (NjHacI)994970000000100431 (oapen)https://directory.doabooks.org/handle/20.500.12854/41515 (EXLCZ)994970000000100431 |
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Tomasz Tański auth Atomic-force Microscopy and Its Applications / edited by Tomasz Tański, Marcin Staszuk, and Bogusław Ziębowicz. IntechOpen 2019 London, United Kingdom : IntechOpen, 2019. 1 online resource (114 pages) : illustrations some color text txt rdacontent computer c rdamedia online resource cr rdacarrier Description based on: online resource; title from PDF information screen (Intech, viewed October 17, 2022). Includes bibliographical references. Open access Unrestricted online access star Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation. English Analytical chemistry. Atomic force microscopy. Physical Sciences Engineering and Technology Chemistry Analytical Chemistry Instrumental Chemistry 1-78985-169-6 Tański, Tomasz, editor. Staszuk, Marcin, editor. Ziębowicz, Bogusław, editor. |
| language |
English |
| format |
eBook |
| author |
Tomasz Tański |
| spellingShingle |
Tomasz Tański Atomic-force Microscopy and Its Applications / |
| author_facet |
Tomasz Tański Tański, Tomasz, Staszuk, Marcin, Ziębowicz, Bogusław, |
| author_variant |
t t tt |
| author2 |
Tański, Tomasz, Staszuk, Marcin, Ziębowicz, Bogusław, |
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t t tt m s ms b z bz |
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TeilnehmendeR TeilnehmendeR TeilnehmendeR |
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Tomasz Tański |
| title |
Atomic-force Microscopy and Its Applications / |
| title_full |
Atomic-force Microscopy and Its Applications / edited by Tomasz Tański, Marcin Staszuk, and Bogusław Ziębowicz. |
| title_fullStr |
Atomic-force Microscopy and Its Applications / edited by Tomasz Tański, Marcin Staszuk, and Bogusław Ziębowicz. |
| title_full_unstemmed |
Atomic-force Microscopy and Its Applications / edited by Tomasz Tański, Marcin Staszuk, and Bogusław Ziębowicz. |
| title_auth |
Atomic-force Microscopy and Its Applications / |
| title_new |
Atomic-force Microscopy and Its Applications / |
| title_sort |
atomic-force microscopy and its applications / |
| publisher |
IntechOpen IntechOpen, |
| publishDate |
2019 |
| physical |
1 online resource (114 pages) : illustrations some color |
| isbn |
1-83881-776-X 1-78985-170-X 1-78985-169-6 |
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Q - Science |
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QD - Chemistry |
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QD75 |
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QD 275 A866 42019 |
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Illustrated |
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500 - Science |
| dewey-tens |
500 - Science |
| dewey-ones |
502 - Miscellany |
| dewey-full |
502.82 |
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3502.82 |
| dewey-raw |
502.82 |
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502.82 |
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