Micro- and Nanotechnology of Wide Bandgap Semiconductors

Owing to their unique characteristics, direct wide bandgap energy, large breakdown field, and excellent electron transport properties, including operation at high temperature environments and low sensitivity to ionizing radiation, gallium nitride (GaN) and related group III-nitride heterostructures...

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Year of Publication:2021
Language:English
Physical Description:1 electronic resource (114 p.)
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100 1 |a Piotrowska, Anna B.  |4 edt 
245 1 0 |a Micro- and Nanotechnology of Wide Bandgap Semiconductors 
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520 |a Owing to their unique characteristics, direct wide bandgap energy, large breakdown field, and excellent electron transport properties, including operation at high temperature environments and low sensitivity to ionizing radiation, gallium nitride (GaN) and related group III-nitride heterostructures proved to be enabling materials for advanced optoelectronic and electronic devices and systems. Today, they are widely used in high performing short wavelength light emitting diodes (LEDs) and laser diodes (LDs), high performing radar, wireless telecommunications, as well ‘green’ power electronics. Impressive progress in GaN technology over the last 25 years has been driven by a continuously growing need for more advanced systems, and still new challenges arise and need to be solved. Actually, lighting industry, RF defene industry, and 5G mmWave telecommunication systems are driving forces for further intense research in order to reach full potential of GaN-based semiconductors. In the literature, there is a number of review papers and publications reporting technology progress and indicating future trends. In this Special Issue of Electronics, eight papers are published, the majority of them focusing materials and process technology of GaN-based devices fabricated on native GaN substrates. The specific topics include: GaN single crystalline substrates for electronic devices by ammonothermal and HVPE methods, Selective – Area Metalorganic Vapour – Phase Epitaxy of GaN and AlGaN/GaN hetereostructures for HEMTs, Advances in Ion Implantation of GaN and Related Materials including high pressure processing (lattice reconstruction) of ion implanted GaN (Mg and Be) and III-Nitride Nanowires for electronic and optoelectronic devices. 
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650 7 |a Technology: general issues  |2 bicssc 
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653 |a GaN 
653 |a crystal growth 
653 |a ammonothermal method 
653 |a HVPE 
653 |a ion implantation 
653 |a gallium nitride 
653 |a thermodynamics 
653 |a ultra-high-pressure annealing 
653 |a diffusion 
653 |a diffusion coefficients 
653 |a molecular beam epitaxy 
653 |a nitrides 
653 |a laser diode 
653 |a tunnel junction 
653 |a LTE 
653 |a AlN 
653 |a AlGaN/GaN 
653 |a interface state density 
653 |a conductance-frequency 
653 |a MISHEMT 
653 |a gallium nitride nanowires 
653 |a polarity 
653 |a Kelvin probe force microscopy 
653 |a selective area growth 
653 |a selective epitaxy 
653 |a AlGaN/GaN heterostructures 
653 |a edge effects 
653 |a effective diffusion length 
653 |a MOVPE 
653 |a nanowires 
653 |a AlGaN 
653 |a LEDs 
653 |a growth polarity 
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700 1 |a Kamińska, Eliana  |4 edt 
700 1 |a Wojtasiak, Wojciech  |4 edt 
700 1 |a Piotrowska, Anna B.  |4 oth 
700 1 |a Kamińska, Eliana  |4 oth 
700 1 |a Wojtasiak, Wojciech  |4 oth 
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