Atomic Force Microscopy : : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / / edited by Victor Bellitto.
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...
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| Place / Publishing House: | [Place of publication not identified] : : IntechOpen,, 2012. |
| Year of Publication: | 2012 |
| Language: | English |
| Physical Description: | 1 online resource (270 pages) |
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(CKB)4970000000097945 (NjHacI)994970000000097945 (oapen)https://directory.doabooks.org/handle/20.500.12854/65873 (EXLCZ)994970000000097945 |
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Bellitto, Victor edt Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / edited by Victor Bellitto. Atomic force microscopy IntechOpen 2012 [Place of publication not identified] : IntechOpen, 2012. 1 online resource (270 pages) text txt rdacontent computer c rdamedia online resource cr rdacarrier Description based on: online resource; title from PDF information screen (InTech, viewed October 20, 2022). Includes bibliographical references and index. Open access Unrestricted online access star With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development. English Spectrum analysis. Mass spectrometry. Electrochemistry & magnetochemistry 953-51-0414-4 Bellitto, Victor, editor. |
| language |
English |
| format |
eBook |
| author2 |
Bellitto, Victor, |
| author_facet |
Bellitto, Victor, |
| author2_variant |
v b vb v b vb |
| author2_role |
TeilnehmendeR |
| title |
Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / |
| spellingShingle |
Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / |
| title_sub |
Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / |
| title_full |
Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / edited by Victor Bellitto. |
| title_fullStr |
Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / edited by Victor Bellitto. |
| title_full_unstemmed |
Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / edited by Victor Bellitto. |
| title_auth |
Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / |
| title_alt |
Atomic force microscopy |
| title_new |
Atomic Force Microscopy : |
| title_sort |
atomic force microscopy : imaging, measuring and manipulating surfaces at the atomic scale / |
| publisher |
IntechOpen IntechOpen, |
| publishDate |
2012 |
| physical |
1 online resource (270 pages) |
| isbn |
953-51-4987-3 953-51-0414-4 |
| callnumber-first |
Q - Science |
| callnumber-subject |
QC - Physics |
| callnumber-label |
QC451 |
| callnumber-sort |
QC 3451 A866 42012 |
| illustrated |
Not Illustrated |
| dewey-hundreds |
500 - Science |
| dewey-tens |
530 - Physics |
| dewey-ones |
535 - Light & infrared & ultraviolet phenomena |
| dewey-full |
535.84 |
| dewey-sort |
3535.84 |
| dewey-raw |
535.84 |
| dewey-search |
535.84 |
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(CKB)4970000000097945 (NjHacI)994970000000097945 (oapen)https://directory.doabooks.org/handle/20.500.12854/65873 (EXLCZ)994970000000097945 |
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Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / |
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