Atomic Force Microscopy : : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / / edited by Victor Bellitto.
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...
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| Place / Publishing House: | [Place of publication not identified] : : IntechOpen,, 2012. |
| Year of Publication: | 2012 |
| Language: | English |
| Physical Description: | 1 online resource (270 pages) |
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Electronic
| DOAB Directory of Open Access Books | Available |