X-ray scattering from semiconductor surfaces and interfaces

X-ray scattering from semiconductor surfaces and interfaces / Elias Vlieg

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VerfasserIn:
Vlieg, Elias
Place / Publishing House:Alkmaar : Costa, 1988
Year of Publication:1988
Language:English
Physical Description:141 S.; graph. Darst.
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spelling Vlieg, Elias aut
X-ray scattering from semiconductor surfaces and interfaces Elias Vlieg
Alkmaar Costa 1988
141 S. graph. Darst.
Leiden, Univ., phil. Diss., 1988
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language English
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author Vlieg, Elias
spellingShingle Vlieg, Elias
X-ray scattering from semiconductor surfaces and interfaces
author_facet Vlieg, Elias
author_variant e v ev
author_role VerfasserIn
author_sort Vlieg, Elias
title X-ray scattering from semiconductor surfaces and interfaces
title_full X-ray scattering from semiconductor surfaces and interfaces Elias Vlieg
title_fullStr X-ray scattering from semiconductor surfaces and interfaces Elias Vlieg
title_full_unstemmed X-ray scattering from semiconductor surfaces and interfaces Elias Vlieg
title_auth X-ray scattering from semiconductor surfaces and interfaces
title_new X-ray scattering from semiconductor surfaces and interfaces
title_sort x-ray scattering from semiconductor surfaces and interfaces
publisher Costa
publishDate 1988
physical 141 S. graph. Darst.
callnumber-raw 20517-B
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illustrated Not Illustrated
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