X-ray scattering from semiconductor surfaces and interfaces / Elias Vlieg
Saved in:
VerfasserIn: | |
---|---|
Place / Publishing House: | Alkmaar : Costa, 1988 |
Year of Publication: | 1988 |
Language: | English |
Physical Description: | 141 S.; graph. Darst. |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
LEADER | 00641nam#a2200229zc#4500 | ||
---|---|---|---|
001 | 990002234240504498 | ||
005 | 20230411185721.0 | ||
007 | tu | ||
008 | 980206|1988####|||######m####|||#|#eng#c | ||
009 | AC02222795 | ||
035 | |a (AT-OBV)AC02222795 | ||
035 | |a AC02222795 | ||
035 | |a (Aleph)002181899ACC01 | ||
035 | |a (DE-599)OBVAC02222795 | ||
035 | |a (EXLNZ-43ACC_NETWORK)990021818990203331 | ||
040 | |a RET |b ger |d OAW |e rakwb | ||
041 | |a eng | ||
044 | |c XA-NL | ||
100 | 1 | |a Vlieg, Elias |4 aut | |
245 | 1 | 0 | |a X-ray scattering from semiconductor surfaces and interfaces |c Elias Vlieg |
264 | 1 | |a Alkmaar |b Costa |c 1988 | |
300 | |a 141 S. |b graph. Darst. | ||
502 | |a Leiden, Univ., phil. Diss., 1988 | ||
ADM | |b 2023-04-11 18:57:21 Europe/Vienna |d 20 |f System |c marc21 |a 2018-12-24 08:25:10 Europe/Vienna |g false | ||
HOL | 8 | |b YWOAW |h 20517-B |c MAG1-3 |8 2217181000004498 | |
852 | 8 | |b YWOAW |c MAG1-3 |h 20517-B |8 2217181000004498 | |
ITM | |9 2217181000004498 |e 1 |m BOOK |b +YW17381207 |i 20517-B |2 MAG1-3 |o 19991231 |8 2317180990004498 |f 02 |p 2011-06-17 02:00:00 Europe/Vienna |h 20517-B |1 YWOAW |q 2022-06-08 18:41:47 Europe/Vienna |