The scale-up of material microstructuring: from scanning probes to self-assembly / Tobias Kraus
Saved in:
Superior document: | Enthalten in Monatshefte für Chemie Wien [u.a.], 2010 141 (2010), 12, S. [1267] - 1272 |
---|---|
VerfasserIn: | |
Place / Publishing House: | 2010 |
Year of Publication: | 2010 |
Language: | English |
Physical Description: | Ill., graph. Darst. |
Notes: | Literaturverz. S. 1272 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Magnetoresistive and Thermoresistive Scanning Probe Microscopy with Applications in Micro- and Nanotechnology
by: Meier, Tobias
Published: (2014) -
Scanning probe microscopy / editors, Nikodem Tomczak, Kuan Eng Johnson Goh.
Published: (2011.) -
Scanning probe microscopy for energy research / editors, Dawn A. Bonnell, Sergei V. Kalinin.
Published: (c2013.) - Self-Assembly of Materials and Their Applications
-
Scanning probe microscopy for industrial applications : : nanomechanical characterization / / edited by Dalia G. Yablon.
Published: (2014.)