Applied logistic regression / David W. Hosmer ; Stanley Lemeshow
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Place / Publishing House: | New York, NY [u.a.] : Wiley, 2000 |
Year of Publication: | 2000 |
Edition: | 2. ed. |
Language: | English |
Series: | Wiley series in probability and statistics : Texts and references section
A Wiley-Interscience publication |
Subjects: | |
Classification: | 31.73 - Mathematische Statistik 44.32 - Medizinische Mathematik. medizinische Statistik |
Online Access: | |
Physical Description: | XII, 375 S.; graph. Darst. |
Notes: | Literaturverz. S. 354 - 367 |
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