Applied logistic regression / David W. Hosmer ; Stanley Lemeshow

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Bibliographic Details
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Place / Publishing House:New York, NY [u.a.] : Wiley, 2000
Year of Publication:2000
Edition:2. ed.
Language:English
Series:Wiley series in probability and statistics : Texts and references section
A Wiley-Interscience publication
Subjects:
Classification:31.73 - Mathematische Statistik
44.32 - Medizinische Mathematik. medizinische Statistik
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Physical Description:XII, 375 S.; graph. Darst.
Notes:Literaturverz. S. 354 - 367
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ISBN:0471356328
9780471356325
ac_no:AC03259800
Hierarchical level:Monograph
Statement of Responsibility: David W. Hosmer ; Stanley Lemeshow