Pattern classification / Richard O. Duda ; Peter E. Hart ; David G. Stork
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Place / Publishing House: | New York, NY [u.a.] : Wiley, 2001 |
Year of Publication: | 2001 |
Edition: | 2. ed. |
Language: | English |
Series: | A Wiley-Interscience publication
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Subjects: | |
Classification: | 54.72 - Künstliche Intelligenz 54.74 - Maschinelles Sehen 31.73 - Mathematische Statistik 38.03 - Methoden und Techniken der Geowissenschaften 74.48 - Geoinformationssysteme |
Physical Description: | XX, 654 S.; Ill., graph. Darst. |
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