Pattern classification / Richard O. Duda ; Peter E. Hart ; David G. Stork
Saved in:
| VerfasserIn: | |
|---|---|
| Place / Publishing House: | New York, NY [u.a.] : Wiley, 2001 |
| Year of Publication: | 2001 |
| Edition: | 2. ed. |
| Language: | English |
| Series: | A Wiley-Interscience publication
|
| Subjects: | |
| Classification: | 54.72 - Künstliche Intelligenz 54.74 - Maschinelles Sehen 31.73 - Mathematische Statistik 38.03 - Methoden und Techniken der Geowissenschaften 74.48 - Geoinformationssysteme |
| Physical Description: | XX, 654 S.; Ill., graph. Darst. |
| Notes: |
|
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|