Röntgenographische Untersuchungen von Si1-xGex-Stranski-Krastanow-Inseln auf Silizium (001) / eingereicht von Thomas Wiebach
Saved in:
VerfasserIn: | |
---|---|
Place / Publishing House: | Berlin, 2000 |
Year of Publication: | 2000 |
Language: | German |
Physical Description: | 85 S.; zahlr. graph. Darst.; 30 cm |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
III-Sb-Schichten auf Silizium(111) / von André Prößdorf
by: Prößdorf, André
Published: (2012) -
Growth and properties of Si1-yCy alloy layers pseudomorphically strained on Si(001) / vorgelegt von Myeongcheol Kim
by: Kim, Myeongcheol
Published: (1997) -
Slovenski rakopisi od Makedonija vo stranski rakopisni zbirki : X-XIX vek / Kniga prva : Arheografski opis / Ǵorgi Pop-Atanasov
by: Pop-Atanasov, Ǵorgi
Published: (2017) -
Slovenski rakopisi od Makedonija vo stranski rakopisni zbirki : X-XIX vek / Ǵorgi Pop-Atanasov
by: Pop-Atanasov, Ǵorgi
Published: (2017-) -
Photolumineszenz aus nanostrukturiertem Silizium / von Wolf-Ekkehard zur Mühlen
by: Mühlen, Wolf-Ekkehard zur
Published: (2000)