Physica status solidi / A. / Volume 109, Number 1, : September 16 / / ed. by Görlich.
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Other title: | Frontmatter -- Author Index -- Physica status solidi (a) applied research -- Contents -- Review Article -- Orientation and Strain in Heteroepitaxial Growth -- Original Papers and Short Notes -- Structure; crystallography -- Crystallization of Metallic Glass Fe 46 N 31 VSi 8 B 14 -- Contrast of Small SiX Particles in Silicon by Computed HREM Images -- Icosahedral Phases in the Al-Fe-Cr Alloy System -- Trial Model for the Tilting Scheme in AgNbO3 Derived by Electron Diffraction and Imaging -- Anisotropie Deformation of a Crystal Plate and Its Analysis with X-Ray Diffraction Methods -- Interaction of Anti-Site Defects with Ge Impurity Atoms in Sb2Te3 Single Crystals -- X-Ray Reflection from and Transmission through a Plane-Parallel Dielectric Plate with Cosine-Like Polarizability (Symmetrical Laue Case) -- Etude structurale, par diffraction de R-X, des liaisons dans les semiconducteurs ternaires ZnSiAs2, ZnGeAs2 et ZnSnAs 2 -- A New Approach for n-beam Lattice Image Calculation -- Defects; nonelectronic transport -- Accumulation and Transformation of Radiation Defects in Silicon under Different Doses and Intensities of Electron Irradiation -- Study of the Movement of Oxygen Vacancies in the Orthorhombic Phase of YBa2Cu3O 7-x by Positron Doppler Broadening Spectroscopy -- Redistribution of Boron in Silicon by High-Temperature Irradiation with Heavy Ions -- Dislocation Groups, Multipoles, and Friction Stresses in a-CuZn Alloys -- Lattice properties -- Deformation Mechanism Maps and Gettering Diagrams for Single-Crystal Silicon -- TEM Study of Phases and Domains in NaNbO3 at Room Temperature -- Low Temperature Plasticity of Brittle Materials -- EPR Study of SO 4 Radicals in K4LiH3(SO4)4 Crystals -- X-Ray Analysis of Residual Stress State with Variable Components of Stress Tensor -- Surfaces, interfaces, thin films; lower-dimensional systems -- The Complex AC Susceptibility of Superconducting Y-Bar-CuO Thin Film and Bulk Samples -- The Current Characteristics of p-i-n and p+-i-p+ Structures Based on Hydrogenated Amorphous Silicon at Various Temperatures and Excitation Levels -- A Reinvestigation of Ni2Si Thin Film Growth on Si(lll) by TEM and RBS -- Structural Analysis of Silicon Doped with High Doses of C+ Ions -- Protective Coatings on GaAs and InP -- Transient Photocurrents in a-Si:H Diodes: Effects of Deep Trapping -- Mechanism of Voltage Generation in Bi Films Due to Laser Irradiation -- Determination of Semiconductor Parameters by Electron Beam Induced Current and Cathodoluminescence Measurements -- Localized electronic states -- Silver Related Deep Levels in Silicon -- DLTS Study of Deep Level Defects in Cz n-Si Due to Heat Treatment at 600 to 900 °C -- Investigation of the Oxygen Vacancy Balance in ZnO Ceramics by Means of EPR -- Electronic transport; superconductivity -- The Internal Strain Effect on T0 in the Y-Ba-Al-Cu Oxide Superconductor -- Magnetic properties; resonances -- Low-Temperature Magnetic Transformations in Ferrous Fluorsilicate Induced by Pressure -- On the Influence of Internal Stress and Magnetizing Frequency on Domain Wall Motion in High-Purity Ni -- Cluster Structure of the Li-Ti-Zn Ferrite System Studied by Neutron Scattering -- Dielectric and optical properties -- The Indirect Allowed Optical Transitions in (Ga 0.3 In 0.7)2 Se 3 -- Positron Annihilation Studies in Non-Metallic Solids: d-Camphor and Silver Iodide -- Nonlinear I-U Characteristics and Photoelectret State in Sillenite-Type Crystals -- Computer Simulation Experiment on the mm-Wave Properties of Indium Phosphide Double Drift Impatts -- Short Notes -- A Special Metastable Phase of Metallic Glass Pd 77.5 Ni 6 Si 16.5 -- SEM-EBIC Investigations of Grain Boundaries in Cadmium Telluride -- Detection of the Active Layer of A III B V Semiconductor Quantum-Well Structures by High Resolution X-Ray Diffractometry -- Structure and Properties of Implanted Steels -- A/2 < 110> Dislocations at the y/y' Interface in a Ni-Based Superalloy -- Two Trapping Centers in the Photoplastic Effect in CdS -- Ru-Metal Segregation in Borosilicate Glasses -- Melting of Multilayered Structures under Pulse Heating (Computational Experiment) -- Non-Equilibrium Gradient-Zone Crystallization in Semiconductors -- Contact Resistance Reduction by Implanted n+ -Layers at the Ni/AuGe- GaAs System -- IR and ESR Studies of the Structural Properties of Hydrogenated Amorphous Carbon Films -- Electron Microscopy and Optical Studies of Chemically Deposited CuInS2 Thin Films -- Electrical Activity Peculiarities of Tin and Iron Impurities in the Semiconducting Glass Ge 28.5 Pb 15S 56.5 -- Photoconductivity and Luminescence Spectra of ZnIn2S4 Crystals Irradiated by y-Quanta -- NMR-Spectroscopy Study of Ca(Cu 30-x Mn x )Mn 4 O 12 Perovskites -- Magnetization in Films with Modulated Surfaces -- Magnetic Properties of UCuGe -- On the Stress Dependence of the Saturation Magnetostriction in Amorphous Alloys -- Effect of Thickness and Length of the Sample on the Dielectric Constant (e') and Loss (e") Measurements in the Microwave Cavity Perturbation Technique -- Thermally Stimulated Electron Emission from Triglycine Sulphate Crystals Excited by AC Electric Field -- Pre-Printed Titles -- Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) -- Substance Classification -- Backmatter |
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Format: | Mode of access: Internet via World Wide Web. |
ISBN: | 9783112495643 9783110637342 |
DOI: | 10.1515/9783112495643 |
Access: | restricted access |
Hierarchical level: | Monograph |
Statement of Responsibility: | ed. by Görlich. |
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